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The FIB/SEM Technique, Atomic Force Microscopy and Acoustic Microscopy for Detection of Subsurface Defects in Thin DLC Coatings
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 668-669
- Print publication:
- August 2005
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- Article
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